Spherical Silica
Megasil™ SS
Description
Spherical Silica powders are used in the production of Epoxy Moulding Compounds (EMCs) and green EMCs (halogen-free, antimony-free). These thermosetting materials encapsulate and protect semiconductor devices (e.g., memory integrated circuits (ICs) tied to 5G and IoT devices) from physical and environmental damage. Their applications include consumer, automotive, and industrial electronics.
Applications
- Consumer
- Automotive
- Industrial Electronics
Technical Specs
Low-A Grades
Physical Characteristics
| Size | SS-U130R | SS-U130H4 | SS-U052H2 | SS-U020H | Unit | Method | |
|---|---|---|---|---|---|---|---|
|
% Passing on Ind. Sieve |
<2μm |
7.22 |
12.12 |
11.86 |
36.31 |
% |
CILAS Laser |
|
<5μm |
24.1 |
32.02 |
50.71 |
86.94 |
% |
CILAS Laser |
|
|
<8μm |
34.55 |
40.29 |
80.22 |
98.30 |
% |
CILAS Laser |
|
|
<12μm |
46.33 |
49.63 |
95.07 |
100.00 |
% |
CILAS Laser |
|
|
<25μm |
66.78 |
77.56 |
100.00 |
100.00 |
% |
CILAS Laser |
|
|
<45μm |
90.09 |
98.96 |
100.00 |
100.00 |
% |
CILAS Laser |
|
|
<75μm |
99.76 |
100.00 |
100.00 |
100.00 |
% |
CILAS Laser |
|
|
Particle Size |
D10 |
2.36 |
1.83 |
1.87 |
1.06 |
μm |
CILAS Laser |
|
D50 |
13.56 |
12.16 |
4.94 |
2.51 |
μm |
CILAS Laser |
|
|
D90 |
13.56 |
12.16 |
4.94 |
2.51 |
μm |
CILAS Laser |
|
|
Moisture Content |
|
0.01 |
0.01 |
0.01 |
0.02 |
wt.% |
105°C oven |
|
pH Value |
|
4.81 |
4.49 |
5.25 |
4.50 |
– |
pH meter |
|
Specific Gravity |
|
2.21 |
2.21 |
2.21 |
2.21 |
– |
pycnometer |
|
Electrical Conductivity |
|
2.3 |
1.70 |
0.40 |
6.40 |
μs/cm |
E.C meter |
|
Specific Surface Area |
|
4.5 |
3.86 |
1.16 |
28.20 |
m2/g |
BET |
|
Circularity |
|
0.97 |
0.95 |
0.97 |
– |
– |
FPIA |
Mean values. These do not represent a specification.
Chemical Analysis (XRF)
| SS-U130R | SS-U130H4 | SS-U052H2 | SS-U020H | Unit | Method | |
|---|---|---|---|---|---|---|
|
SiO2 |
99.8 |
99.9 |
99.9 |
99.9 |
ppm |
XRF |
|
Al2O3 |
826 |
491 |
129 |
654 |
ppm |
XRF |
|
Fe2O3 |
47 |
48 |
40 |
133 |
ppm |
XRF |
|
Na2O |
47 |
15 |
25 |
32 |
ppm |
XRF |
Mean values. These do not represent a specification.
Ionic Impurities (IC)
| SS-U130R | SS-U130H4 | SS-U052H2 | SS-U020H | Unit | Method | |
|---|---|---|---|---|---|---|
|
Na+ |
2.4 |
1.0 |
1.1 |
8.4 |
ppm |
I.C |
|
Cl– |
1.3 |
0.4 |
0.9 |
1.4 |
ppm |
I.C |
Mean values. These do not represent a specification.
Standard Grades, Blended Type
Physical Characteristics
| Size | SS-0140R | SS-0160R | SS-0160H | SS-0170R | SS-0140C5 | Unit | Method | |
|---|---|---|---|---|---|---|---|---|
|
% Passing on Ind. Sieve |
<2μm |
7.98 |
8.99 |
8.16 |
8.29 |
36.31 |
% |
CILAS Laser |
|
<5μm |
25.73 |
27.76 |
30.96 |
26.04 |
27.84 |
% |
CILAS Laser |
|
|
<8μm |
34.00 |
37.29 |
40.17 |
35.80 |
36.50 |
% |
CILAS Laser |
|
|
<12μm |
42.67 |
47.68 |
47.59 |
43.00 |
45.61 |
% |
CILAS Laser |
|
|
<25μm |
59.71 |
67.73 |
62.03 |
60.46 |
64.61 |
% |
CILAS Laser |
|
|
<45μm |
88.01 |
90.70 |
86.86 |
86.90 |
91.94 |
% |
CILAS Laser |
|
|
<75μm |
99.74 |
99.80 |
99.61 |
99.63 |
99.91 |
% |
CILAS Laser |
|
|
Particle Size |
D10 |
2.24 |
2.11 |
2.23 |
2.20 |
2.12 |
μm |
CILAS Laser |
|
D50 |
16.71 |
13.08 |
13.60 |
16.49 |
12.98 |
μm |
CILAS Laser |
|
|
D90 |
47.23 |
44.15 |
48.58 |
48.46 |
42.45 |
μm |
CILAS Laser |
|
|
Moisture Content |
|
0.01 |
0.01 |
0.01 |
0.01 |
0.01 |
wt.% |
105°C oven |
|
pH Value |
|
4.45 |
4.50 |
4.50 |
4.54 |
4.40 |
– |
pH meter |
|
Specific Gravity |
|
2.21 |
2.21 |
2.21 |
2.21 |
2.21 |
– |
pycnometer |
|
Electrical Conductivity |
|
1.70 |
1.70 |
1.70 |
1.30 |
2.20 |
μs/cm |
E.C meter |
|
Specific Surface Area |
|
3.20 |
4.90 |
3.90 |
3.70 |
4.10 |
m2/g |
BET |
|
Circularity |
|
0.95 |
0.95 |
0.95 |
0.95 |
0.96 |
– |
FPIA |
Mean values. These do not represent a specification.
Chemical Analysis (XRF)
| SS-0140R | SS-0160R | SS-0160H | SS-0170R | SS-0140C5 | Unit | Method | |
|---|---|---|---|---|---|---|---|
|
SiO2 |
99.8 |
99.8 |
99.8 |
99.8 |
99.8 |
% |
XRF |
|
Al2O3 |
1119 |
998 |
898 |
926 |
1189 |
ppm |
XRF |
|
Fe2O3 |
75 |
50 |
38 |
51 |
67 |
ppm |
XRF |
|
Na2O |
59 |
43 |
19 |
53 |
26 |
ppm |
XRF |
Mean values. These do not represent a specification.
Ionic Impurities (IC)
| SS-0140R | SS-0160R | SS-0160H | SS-0170R | SS-0140C5 | Unit | Method | |
|---|---|---|---|---|---|---|---|
|
Na+ |
1.8 |
2.2 |
1.3 |
1.7 |
2.0 |
ppm |
I.C |
|
Cl– |
2.1 |
1.3 |
1.3 |
1.5 |
1.8 |
ppm |
I.C |
Mean values. These do not represent a specification.
Standard Grades, Singular Component
Physical Characteristics
| Size | SS-0030 | SS-0090 | SS-0250 | SS-0300 | Unit | Method | |
|---|---|---|---|---|---|---|---|
|
% Passing on Ind. Sieve |
<2μm |
12.23 |
8.9 |
4.68 |
4.73 |
% |
CILAS Laser |
|
<5μm |
53.92 |
26.74 |
12.91 |
14.63 |
% |
CILAS Laser |
|
|
<8μm |
72.26 |
43.04 |
17.09 |
19.78 |
% |
CILAS Laser |
|
|
<12μm |
86.45 |
67.14 |
24.33 |
27.20 |
% |
CILAS Laser |
|
|
<25μm |
99.42 |
96.99 |
48.14 |
47.51 |
% |
CILAS Laser |
|
|
% Passing on Ind. Sieve |
<45μm |
100 |
100 |
80.53 |
78.05 |
% |
CILAS Laser |
|
<75μm |
100 |
100 |
99.63 |
99.48 |
% |
CILAS Laser |
|
|
Particle Size |
D10 |
1.65 |
2.12 |
3.46 |
3.20 |
μm |
CILAS Laser |
|
D50 |
4.55 |
9.09 |
26.04 |
26.70 |
μm |
CILAS Laser |
|
|
D90 |
13.59 |
18.73 |
53.26 |
54.94 |
μm |
CILAS Laser |
|
|
Moisture Content |
|
0.02 |
0.01 |
0.01 |
0.01 |
wt.% |
105°C oven |
|
pH Value |
|
4.14 |
4.86 |
4.96 |
5.01 |
– |
pH meter |
|
Specific Gravity |
|
2.21 |
2.21 |
2.21 |
2.21 |
– |
pycnometer |
|
Electrical Conductivity |
|
4.8 |
1.7 |
0.80 |
0.90 |
μs/cm |
E.C meter |
|
Specific Surface Area |
|
11.6 |
1.6 |
1.1 |
0.9 |
m2/g |
BET |
|
Circularity |
|
0.85 |
0.91 |
0.85 |
0.87 |
– |
FPIA |
|
Sieve Residue |
45 μm On |
0.14 |
0.04 |
11.58 |
11.93 |
wt.% |
Wet Sieve |
|
Sieve Residue |
75 μm On |
0 |
0 |
0.02 |
0.02 |
wt.% |
Wet Sieve |
|
Sieve Residue |
106 μm On |
0 |
0 |
0 |
|
wt.% |
Wet Sieve |
Mean values. These do not represent a specification.
Chemical Analysis (XRF)
| SS-0030 | SS-0090 | SS-0250 | SS-0300 | Unit | Method | |
|---|---|---|---|---|---|---|
|
SiO2 |
99.7 |
99.8 |
99.8 |
99.8 |
% |
XRF |
|
Al2O3 |
1216 |
610 |
597 |
1040 |
ppm |
XRF |
|
Fe2O3 |
86 |
43 |
48 |
48 |
ppm |
XRF |
|
Na2O |
55 |
43 |
40 |
40 |
ppm |
XRF |
Mean values. These do not represent a specification.
Ionic Impurities (IC)
| SS-0030 | SS-0090 | SS-0250 | SS-0300 | Unit | Method | |
|---|---|---|---|---|---|---|
|
Na+ |
2.8 |
2.4 |
1.3 |
0.8 |
ppm |
I.C |
|
Cl– |
2.4 |
2.6 |
1.1 |
1.3 |
ppm |
I.C |
Mean values. These do not represent a specification.
